Recently, Beijing Lingbang Instruments developed the "Intelligent Ammunition Comprehensive Testing System," which features electrical perfo…
Recently, Beijing Lingbang Instruments developed the "Intelligent Ammunition Comprehensive Testing System," which features electrical performance testing capabilities and can test angle stability parameters and distance correction parameters of intelligent ammunition. The system also expands non-electrical testing functions such as temperature, pressure, and vibration, enabling measurements of transient temperature, detonation pressure, vibration frequency, and other non-electrical quantities. The system is highly extensible, allowing you to freely add new product types and set test items and parameters. After minor modifications, it can be applied to comprehensive performance testing of various types of intelligent ammunition (terminal sensitive rounds).
Intelligent Ammunition Comprehensive Testing System
Whether the intelligent ammunition control system can function properly depends on whether every system component in the control compartment is functioning properly and whether the interconnections between components are reliable. Therefore, overall performance testing of analog control systems is crucial.
It is understood that traditional methods for testing intelligent ammunition control systems generally use specialized equipment, where each device can only test one or several performance items and cannot be expanded, making it inconvenient to use. With the development of intelligent ammunition technology, traditional specialized testing equipment with single functions can no longer meet requirements. The adoption of new comprehensive testing equipment for comprehensive performance testing of intelligent ammunition has gradually become an inevitable trend.
Beijing Lingbang Instruments' developed the "Intelligent Ammunition Comprehensive Testing System," which uses virtual instrument technology and features electrical performance testing functions. It also expands non-electrical testing functions such as temperature, pressure, and vibration, capable of measuring transient temperature, detonation pressure, vibration frequency, and other non-electrical quantities.
The system uses PXI bus technology. The data acquisition card provides input excitation signals for the product under test, while the output signals of the tested product and various external sensor signals are conditioned through the signal conditioning chassis and transmitted to the data acquisition card, where the system software analyzes and processes them.
This system can perform tests of the control cabin's "angle stabilization system," "distance correction system," and "comprehensive electrical performance of the entire projectile," enabling integrated measurements of vibration, pressure, and temperature, and features real-time data and waveform display functions.
Its vibration frequency testing range is 0~30k Hz, with a measurement error not exceeding 50 Hz; Pressure test range is 0~100 MPa, with a test error of 3% F.S.; temperature measurement range is -50°C~1800°C, with a measurement error of 3% F.S., and temperature response time not exceeding 100μs. The system can automatically store collected data, various parameters, and waveforms, and determine whether they are qualified based on set values.
The system is highly extensible, allowing you to freely add new product types and set test items and parameters. The entire system mainly uses virtual instrument technology for display and features a modular design for rapid fault localization. Based on configured parameters, it automatically determines compliance, saves data automatically, and generates reports automatically.
The successful development of the intelligent ammunition integrated testing system has made it possible to transform the testing of intelligent ammunition control systems from multiple specialized instruments to a single integrated device. Reducing the number of instruments on a macro level saves users significant costs. It adds equipment functionality on a microscopic level, improving testing efficiency.
Article link: China Instrument Network http://www.ybzhan.cn/News/Detail/37862.html
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